Best Paper Award from IEEE European Test Symposium (2009, 2012, 2015)
- S. El‑Sayed, Th. Spyrou, A. Pavlidis, E. Afacan, L. Camuñas‑Mesa, B. Linares‑Barranco, Haralampos‑G. Stratigopoulos : “Spiking Neuron Hardware-Level Fault Modeling”, 26th IEEE International Symposium on On-Line Testing and Robust System Design, Naples, Italy (2020).
- M. Elshamy, G. Di Natale, A. Pavlidis, M.‑M. Louërat, Haralampos‑G. Stratigopoulos : “Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access Mechanism”, IEEE European Test Symposium, Tallinn, Estonia (2020).
- M. Elshamy, A. Sayed, M.‑M. Louërat, A. Rhouni, H. Aboushady, Haralampos‑G. Stratigopoulos : “Securing Programmable Analog ICs Against Piracy”, Design, Automation and Test in Europe Conference, Grenoble, France (2020).
- A. Pavlidis, M.‑M. Louërat, E. Faehn, A. Kumar, Haralampos‑G. Stratigopoulos : “Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP”, Design, Automation and Test in Europe Conference, Grenoble, France (2020).
- J. Leonhard, M.‑M. Louërat, H. Aboushady, O. Sinanoglu, Haralampos‑G. Stratigopoulos : “Mixed-Signal IP Protection Against Piracy Based on Logic Locking”, 32. GI / GMM / ITG - Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, Ludwigsburg, Germany (2020).
Microelectronics Institute of Sevilla, The University of Texas at Dallas, École Central de Lyon/INL, Université de Rennes/IRISA, Université Grenoble Alpes/TIMA
Thales
Intel